Research on Industrial Technology Barrier Identification from a Semantic and Evolutionary Perspective: The Case of Lithography
Ran Congjing Cheng Fan Li Wang Jiang Yunlong
School of Information Management, Wuhan University, Wuhan, 430072
Online:2026-03-26
Published:2026-06-04
About author:Ran Congjing, Ph.D., professor, doctoral supervisor, research interests including intellectual property, big data governance; Cheng Fan(corresponding author), Ph.D. candidate, research interests including data intelligence and intelligence analysis, intellectual property, Email: 15072381099@163.com; Li Wang, Ph.D. candidate, research interests including data science, intellectual property; Jiang Yunlong, master candidate, research interests including data intelligence, data governance.
Supported by:
This work is supported by the National Natural Science Program of China, "Identification of High Quality Patents in Emerging Technologies Based on Graph Convolutional Neural Networks and Its Evolutionary Study"(72274084) and the Shandong Province Natural Science Foundation Youth Project "Research on Intelligent Matching Method of Supply and Demand for University-Enterprise Technology Cooperation Based on Patent Measurement and Machine Learning"(ZR2023QG105).
Ran Congjing Cheng Fan Li Wang Jiang Yunlong. Research on Industrial Technology Barrier Identification from a Semantic and Evolutionary Perspective: The Case of Lithography[J]. Journal of Information Resources Management, 2026, 16(2): 82-97.